Special Section on Speckle-Based Metrology

Vibration mode shapes visualization in industrial environment by real-time time-averaged phase-stepped electronic speckle pattern interferometry at 10.6  μm and shearography at 532 nm

[+] Author Affiliations
Fabian Languy, Jean-François Vandenrijt, Cédric Thizy, Marc P. Georges

Université de Liège, Centre Spatial de Liège, Liege Science Park, B-4031 Angleur (Liège), Belgium

Jonathan Rochet, Christophe Loffet, Daniel Simon

V2i S.A., Liege Science Park, B-4031 Angleur (Liège), Belgium

Opt. Eng. 55(12), 121704 (Jun 01, 2016). doi:10.1117/1.OE.55.12.121704
History: Received March 3, 2016; Accepted May 5, 2016
Text Size: A A A

Abstract.  We present our investigations on two interferometric methods suitable for industrial conditions dedicated to the visualization of vibration modes of aeronautic blades. First, we consider long-wave infrared (LWIR) electronic speckle pattern interferometry (ESPI). The use of long wavelength allows measuring larger amplitudes of vibrations compared with what can be achieved with visible light. Also longer wavelengths allow lower sensitivity to external perturbations. Second, shearography at 532 nm is used as an alternative to LWIR ESPI. Both methods are used in time-averaged mode with the use of phase-stepping. This allows transforming Bessel fringes, typical to time averaging, into phase values that provide higher contrast and improve the visualization of vibration mode shapes. Laboratory experimental results with both techniques allowed comparison of techniques, leading to selection of shearography. Finally a vibration test on electrodynamic shaker is performed in an industrial environment and mode shapes are obtained with good quality by shearography.

Figures in this Article
© 2016 Society of Photo-Optical Instrumentation Engineers

Citation

Fabian Languy ; Jean-François Vandenrijt ; Cédric Thizy ; Jonathan Rochet ; Christophe Loffet, et al.
"Vibration mode shapes visualization in industrial environment by real-time time-averaged phase-stepped electronic speckle pattern interferometry at 10.6  μm and shearography at 532 nm", Opt. Eng. 55(12), 121704 (Jun 01, 2016). ; http://dx.doi.org/10.1117/1.OE.55.12.121704


Tables

Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.