Special Section on Speckle-Based Metrology

High-speed imaging optical techniques for shockwave and droplets atomization analysis

[+] Author Affiliations
Pierre R. Slangen, Pierre Lauret, Frederic Heymes, Laurent Aprin

Institute for Risk Sciences, LGEI, Ecole des Mines d’Alès, 30319 Alès Cedex, France

Nicolas Lecysyn

CEA Gramat, BP80200, 46500 Gramat, France

Opt. Eng. 55(12), 121706 (Jun 20, 2016). doi:10.1117/1.OE.55.12.121706
History: Received April 15, 2016; Accepted June 1, 2016
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Abstract.  Droplets atomization by shockwave can act as a consequence in domino effects on an industrial facility: aggression of a storage tank (projectile from previous event, for example) can cause leakage of hazardous material (toxic and flammable). As the accident goes on, a secondary event can cause blast generation, impacting the droplets and resulting in their atomization. Therefore, exchange surface increase impacts the evaporation rate. This can be an issue in case of dispersion of such a cloud. The experiments conducted in the lab generate a shockwave with an open-ended shock tube to break up liquid droplets. As the expected shockwave speed is about 400  m/s (Mach  1.2), the interaction with falling drops is very short. High-speed imaging is performed at about 20,000 fps. The shockwave is measured using both overpressure sensors: particle image velocimetry and pure in line shadowgraphy. The size of fragmented droplets is optically measured by direct shadowgraphy simultaneously in different directions. In these experiments, secondary breakups of a droplet into an important number of smaller droplets from the shockwave-induced flow are shown. The results of the optical characterizations are discussed in terms of shape, velocity, and size.

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© 2016 Society of Photo-Optical Instrumentation Engineers

Citation

Pierre R. Slangen ; Pierre Lauret ; Frederic Heymes ; Laurent Aprin and Nicolas Lecysyn
"High-speed imaging optical techniques for shockwave and droplets atomization analysis", Opt. Eng. 55(12), 121706 (Jun 20, 2016). ; http://dx.doi.org/10.1117/1.OE.55.12.121706


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