Special Section on Speckle-Based Metrology

Object localization using the statistical behavior of volume speckle fields

[+] Author Affiliations
Timothy Joseph T. Abregana, Percival F. Almoro

University of the Philippines, National Institute of Physics, Diliman, Quezon City 1101, Philippines

Opt. Eng. 55(12), 121720 (Aug 04, 2016). doi:10.1117/1.OE.55.12.121720
History: Received March 15, 2016; Accepted July 14, 2016
Text Size: A A A

Abstract.  Speckle noise presents challenges in object localization using reconstructed wavefronts. Here, a technique for axial localization of rough test objects based on a statistical algorithm that processes volume speckle fields is demonstrated numerically and experimentally. The algorithm utilizes the standard deviation of phase difference maps as a metric to characterize the object wavefront at different axial locations. Compared with an amplitude-based localization method utilizing energy of image gradient, the technique is shown to be robust against speckle noise.

Figures in this Article
© 2016 Society of Photo-Optical Instrumentation Engineers

Citation

Timothy Joseph T. Abregana and Percival F. Almoro
"Object localization using the statistical behavior of volume speckle fields", Opt. Eng. 55(12), 121720 (Aug 04, 2016). ; http://dx.doi.org/10.1117/1.OE.55.12.121720


Tables

Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

PubMed Articles
Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Article
Sign in or Create a personal account to Buy this article ($20 for members, $25 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.