Special Section on Speckle-Based Metrology

Digital holographic interferometry in the long-wave infrared and temporal phase unwrapping for measuring large deformations and rigid body motions of segmented space detector in cryogenic test

[+] Author Affiliations
Jean-François Vandenrijt, Cédric Thizy, Marc P. Georges

Université de Liège, Centre Spatial de Liège, Liege Science Park, B-4031 Angleur, Belgium

Laurent Martin, Florent Beaumont, José Garcia, Christophe Fabron, Éric Prieto, Thierry Maciaszek

Laboratoire d’Astrophysique de Marseille, 38 rue Frédéric Joliot-Curie, 13388 Marseille cedex 13, France

Opt. Eng. 55(12), 121723 (Aug 12, 2016). doi:10.1117/1.OE.55.12.121723
History: Received April 30, 2016; Accepted June 30, 2016
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Abstract.  We present digital holographic interferometry (DHI) in the long-wave infrared for monitoring the deformation under cryogenic conditions of a segmented focal plane array to be used in a space mission. The long wavelength was chosen for its ability to allow measurement of displacements 20 times larger than DHI in the visible, which were foreseen with the test object under large temperature variations. The latter is a mosaic of 4×4 detectors assembled on a frame. DHI was required to assess the global deformation of the assembly, the deformation of each detector, and out-of-plane movements of each of them with respect to their neighbors. For that reason, we incorporated the temporal phase unwrapping by capturing a sufficiently high number of holograms between which the phase does not undergo large variations. At last, since the specimen exhibits specular reflectivity at that wavelength, it is illuminated by means of a reflective diffuser.

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© 2016 Society of Photo-Optical Instrumentation Engineers

Citation

Jean-François Vandenrijt ; Cédric Thizy ; Laurent Martin ; Florent Beaumont ; José Garcia, et al.
"Digital holographic interferometry in the long-wave infrared and temporal phase unwrapping for measuring large deformations and rigid body motions of segmented space detector in cryogenic test", Opt. Eng. 55(12), 121723 (Aug 12, 2016). ; http://dx.doi.org/10.1117/1.OE.55.12.121723


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