Instrumentation, Techniques, and Measurement

Effects of heavy ion radiation on digital micromirror device performance

[+] Author Affiliations
Anton Travinsky, Dmitry Vorobiev, Zoran Ninkov

Rochester Institute of Technology, Center for Imaging Science, 54 Lomb Memorial Drive, Rochester, New York 14623, United States

Alan D. Raisanen

Rochester Institute of Technology, Department of Manufacturing and Mechanical Engineering Technology, 78 Lomb Memorial Drive, Rochester, New York 14623, United States

Jonny Pellish, Sara Heap

NASA Goddard Space Flight Center, 8800 Greenbelt Road, Greenbelt, Maryland 20771, United States

Massimo Robberto

Space Telescope Sciences Institute, 3700 San Martin Drive, Baltimore, Maryland 21218, United States

Opt. Eng. 55(9), 094107 (Sep 29, 2016). doi:10.1117/1.OE.55.9.094107
History: Received July 18, 2016; Accepted September 12, 2016
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Abstract.  There is a pressing need in the astronomical community for space-suitable multiobject spectrometers (MOSs). Several digital micromirror device (DMD)-based prototype MOSs have been developed for ground-based observatories; however, their main use will come with deployment on a space-based mission. Therefore, the performance of DMDs under exoatmospheric radiation needs to be evaluated. DMDs were rewindowed with 2-μm thick pellicle and tested under accelerated heavy-ion radiation (control electronics shielded from radiation), with a focus on the detection of single-event effects (SEEs) including latch-up events. Testing showed that while DMDs are sensitive to nondestructive ion-induced state changes, all SEEs are cleared with a soft reset (i.e., sending a pattern to the device). The DMDs did not experience single-event induced permanent damage or functional changes that required a hard reset (power cycle), even at high ion fluences. This suggests that the SSE rate burden will be manageable for a DMD-based instrument when exposed to solar particle fluxes and cosmic rays in orbit.

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© 2016 Society of Photo-Optical Instrumentation Engineers

Citation

Anton Travinsky ; Dmitry Vorobiev ; Zoran Ninkov ; Alan D. Raisanen ; Jonny Pellish, et al.
"Effects of heavy ion radiation on digital micromirror device performance", Opt. Eng. 55(9), 094107 (Sep 29, 2016). ; http://dx.doi.org/10.1117/1.OE.55.9.094107


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