Instrumentation, Techniques, and Measurement

Raman analyzer for sensitive natural gas composition analysis

[+] Author Affiliations
Rachit Sharma, Samhitha Poonacha, Anish Bekal, Sameer Vartak, Vinayak Tilak, Chayan Mitra

GE Global Research Center, Plot 122, EPIP Phase 2, Whitefield Road, Bangalore 560066, India

Aniruddha Weling

GE Oil and Gas, 1100 Technology Park Drive, Billerica, Massachusetts 01821, United States

Opt. Eng. 55(10), 104103 (Oct 06, 2016). doi:10.1117/1.OE.55.10.104103
History: Received July 19, 2016; Accepted September 15, 2016
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Abstract.  Raman spectroscopy is of significant importance in industrial gas analysis due to its unique capability of quantitative multigas measurement, especially diatomics (N2 and H2), with a single laser. This paper presents the development of a gas analyzer system based on high pressure Raman scattering in a multipass Raman cell and demonstrates its feasibility for real-time natural gas analysis. A 64-pass Raman cell operated at elevated pressure (5 bar) is used to create multiplicative enhancement (proportional to number of passes times pressure) of the natural gas Raman signal. A relatively low power 532-nm continuous wave laser beam (200 mW) is used as the source and the signals are measured through a cooled charge-coupled device grating spectrometer (30-s exposure). A hybrid algorithm based on background-correction and least-squares error minimization is used to estimate gas concentrations. Individual gas component concentration repeatability of the order of 0.1% is demonstrated. Further, the applicability of the technique for natural gas analysis is demonstrated through measurements on calibrated gas mixtures. Experimental details, analyzer characterization, and key measurements are presented to demonstrate the performance of the technique.

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© 2016 Society of Photo-Optical Instrumentation Engineers

Citation

Rachit Sharma ; Samhitha Poonacha ; Anish Bekal ; Sameer Vartak ; Aniruddha Weling, et al.
"Raman analyzer for sensitive natural gas composition analysis", Opt. Eng. 55(10), 104103 (Oct 06, 2016). ; http://dx.doi.org/10.1117/1.OE.55.10.104103


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