Special Section on Speckle-Based Metrology

CMOS and sCMOS imaging performance comparison by digital holographic interferometry

[+] Author Affiliations
Jorge Mauricio Flores-Moreno, Manuel H. De la Torre Ibarra, María del Socorro Hernández-Montes, Carlos Perez Lopez, Fernando Mendoza Santoyo

Centro de Investigaciones en Óptica, A.C., Loma del Bosque 115, León, 37150, México

Opt. Eng. 55(12), 121728 (Oct 20, 2016). doi:10.1117/1.OE.55.12.121728
History: Received April 29, 2016; Accepted September 26, 2016
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Abstract.  We use a digital holographic interferometric setup to assess, as a proof of concept, two state-of-the-art sensors (CMOS and sCMOS cameras) that are widely used in nondestructive testing (NDT). This interferometric study is intended to evaluate the image quality recorded by any camera used in NDT. The assessing relies on the quantification of the optical phase information recovered by the cameras used for this study. For this, we calculate the signal-to-noise ratio, correlation coefficient, and quality index (Q-index) as main figures-of-merit. As far as we know, the Q-index has not been used for evaluation of the optical phase coming from image holograms. The CMOS and sCMOS sensors used record the same deformation event under the same experimental conditions. The experiment involves the inspection of a large sample (>1  m2 of area) which implies low illumination conditions for the imaging sensors. The retrieved CMOS optical phase shows artifacts that are not observed in the sCMOS. An analysis of these two groups of interferometric images is presented and discussed. The methodology set forth here can be applied to evaluate other sensors such as CCDs and EM-CCDs.

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© 2016 Society of Photo-Optical Instrumentation Engineers

Citation

Jorge Mauricio Flores-Moreno ; Manuel H. De la Torre Ibarra ; María del Socorro Hernández-Montes ; Carlos Perez Lopez and Fernando Mendoza Santoyo
"CMOS and sCMOS imaging performance comparison by digital holographic interferometry", Opt. Eng. 55(12), 121728 (Oct 20, 2016). ; http://dx.doi.org/10.1117/1.OE.55.12.121728


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