Imaging Components, Systems, and Processing

Automated optical inspection of liquid crystal display anisotropic conductive film bonding

[+] Author Affiliations
Guangming Ni, Xiaohui Du, Lin Liu, Jing Zhang, Juanxiu Liu, Yong Liu

University of Electronic Science and Technology of China, State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Information, No. 4, Section 2, North Jianshe Road, Chengdu 610054, China

Opt. Eng. 55(10), 103109 (Oct 21, 2016). doi:10.1117/1.OE.55.10.103109
History: Received June 17, 2016; Accepted October 4, 2016
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Abstract.  Anisotropic conductive film (ACF) bonding is widely used in the liquid crystal display (LCD) industry. It implements circuit connection between screens and flexible printed circuits or integrated circuits. Conductive microspheres in ACF are key factors that influence LCD quality, because the conductive microspheres’ quantity and shape deformation rate affect the interconnection resistance. Although this issue has been studied extensively by prior work, quick and accurate methods to inspect the quality of ACF bonding are still missing in the actual production process. We propose a method to inspect ACF bonding effectively by using automated optical inspection. The method has three steps. The first step is that it acquires images of the detection zones using a differential interference contrast (DIC) imaging system. The second step is that it identifies the conductive microspheres and their shape deformation rate using quantitative analysis of the characteristics of the DIC images. The final step is that it inspects ACF bonding using a back propagation trained neural network. The result shows that the miss rate is lower than 0.1%, and the false inspection rate is lower than 0.05%.

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© 2016 Society of Photo-Optical Instrumentation Engineers

Citation

Guangming Ni ; Xiaohui Du ; Lin Liu ; Jing Zhang ; Juanxiu Liu, et al.
"Automated optical inspection of liquid crystal display anisotropic conductive film bonding", Opt. Eng. 55(10), 103109 (Oct 21, 2016). ; http://dx.doi.org/10.1117/1.OE.55.10.103109


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