Accuracy and uncertainty in random speckle modulation transfer function measurement of infrared focal plane arrays

Kenneth J. Barnard; Eddie L. Jacobs; Philip J. Plummer

doi:10.1117/1.OE.55.12.121729

27 October 2016 Accuracy and uncertainty in random speckle modulation transfer function measurement of infrared focal plane arrays

Kenneth J. Barnard, Eddie L. Jacobs, Philip J. Plummer

Author Affiliations +

Optical Engineering, Vol. 55, Issue 12, 121729 (October 2016). https://doi.org/10.1117/1.OE.55.12.121729

Abstract

This paper expands upon a previously reported random speckle technique for measuring the modulation transfer function of midwave infrared focal plane arrays by considering a number of factors that impact the accuracy of the estimated modulation transfer function. These factors arise from assumptions in the theoretical derivation and bias in the estimation procedure. Each factor is examined and guidelines are determined to maintain accuracy within 2% of the true value. The uncertainty of the measurement is found by applying a one-factor ANOVA analysis and confidence intervals are established for the results. The small magnitude of the confidence intervals indicates a very robust technique capable of distinguishing differences in modulation transfer function among focal plane arrays on the order of a few percent. This analysis directly indicates the high quality of the random speckle modulation transfer function measurement technique. The methodology is applied to a focal plane array and results are presented that emphasize the need for generating independent random speckle realizations to accurately assess measured values.

Citation Download Citation

Kenneth J. Barnard, Eddie L. Jacobs, and Philip J. Plummer "Accuracy and uncertainty in random speckle modulation transfer function measurement of infrared focal plane arrays," Optical Engineering 55(12), 121729 (27 October 2016). https://doi.org/10.1117/1.OE.55.12.121729

Published: 27 October 2016

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