Lasers, Fiber Optics, and Communications

Temperature characteristics of tilted wave lasers

[+] Author Affiliations
Mikhail V. Maximov, Nikita Yu. Gordeev, Yuri M. Shernyakov, Alexey S. Payusov, Nikolay A. Kalyuzhnyy, Sergey A. Mintairov, Alexey E. Zhukov

St. Petersburg Academic University, 8/3 Khlopina, St. Petersburg 194021, Russia

Ioffe Institute, 26 Politekhnicheskaya, St. Petersburg 194021, Russia

Marina M. Kulagina

Ioffe Institute, 26 Politekhnicheskaya, St. Petersburg 194021, Russia

Vitaly A. Shchukin, Nikolai N. Ledentsov

St. Petersburg Academic University, 8/3 Khlopina, St. Petersburg 194021, Russia

Ioffe Institute, 26 Politekhnicheskaya, St. Petersburg 194021, Russia

VI Systems GmbH, 7 Hardenbergstrasse, Berlin D-10623, Germany

Opt. Eng. 55(11), 116102 (Nov 10, 2016). doi:10.1117/1.OE.55.11.116102
History: Received July 29, 2016; Accepted October 24, 2016
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Abstract.  We report on the temperature characteristics of edge-emitting tilted wave lasers (TWL) composed of a thin active waveguide (0.7  μm) optically coupled to a thick passive waveguide (26  μm). The active region is based on four 1040-nm InGaAs/GaAs quantum wells. The 2-mm-long and 50-μm-wide broad area lasers show characteristic temperature of 115 K and lasing up to 120°C in the continuous-wave mode. The maximal pulsed output power as high as 40 W was achieved being limited by the available current source. Vertical far-fields of the TWLs consist of two tilted narrow lobs (2.4 deg full width at half maximum each), which contain >70% of the total output power. The tilt angle of the lobes slightly increases with the temperature (by 1 deg/40°C) due to the transverse mode hopping caused by the temperature-induced changes of the waveguide refractive indices.

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© 2016 Society of Photo-Optical Instrumentation Engineers

Citation

Mikhail V. Maximov ; Nikita Yu. Gordeev ; Yuri M. Shernyakov ; Alexey S. Payusov ; Nikolay A. Kalyuzhnyy, et al.
"Temperature characteristics of tilted wave lasers", Opt. Eng. 55(11), 116102 (Nov 10, 2016). ; http://dx.doi.org/10.1117/1.OE.55.11.116102


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