Development and characterization of high refractive index and high scattering acrylate polymer layers

Thomas Eiselt; Guillaume Gomard; Jan Preinfalk; Uwe Gleissner; Uli Lemmer; Thomas Hanemann

doi:10.1117/1.OE.55.11.117106

30 November 2016 Development and characterization of high refractive index and high scattering acrylate polymer layers

Thomas Eiselt, Guillaume Gomard, Jan Preinfalk, Uwe Gleissner, Uli Lemmer, Thomas Hanemann

Author Affiliations +

Optical Engineering, Vol. 55, Issue 11, 117106 (November 2016). https://doi.org/10.1117/1.OE.55.11.117106

Abstract

In this work, we develop a wet-processable scattering layer exhibiting a high refractive index that can be used in organic light-emitting diodes for light outcoupling purposes. The composite layers contain an acrylate casting resin, benzylmethacrylate, and phenanthrene, which is employed to increase the refractive index. The mixtures are first rheologically characterized and then polymerized with heat and UV radiation. For the refractive index measurements, the polymerized samples require a planar surface without air bubbles. To produce flat samples, a special construction consisting of a glass plate, a teflon sheet, a silicone ring (PDMS mold), another teflon sheet, and another glass plate is developed. Glue clamps are used to hold the construction together. The refractive index of the samples can be increased from 1.565 to 1.585 at 20°C at a wavelength of 589 nm following the addition of 20 wt% phenanthrene. A master mixture with a high refractive index is taken for further experiments. Nanoscaled titanium dioxide is added and dispersed into the master mixture and then spin coated on a glass substrate. These layers are optically characterized. Most of the presented layers present the expected haze of over 50%.

Citation Download Citation

Thomas Eiselt, Guillaume Gomard, Jan Preinfalk, Uwe Gleissner, Uli Lemmer, and Thomas Hanemann "Development and characterization of high refractive index and high scattering acrylate polymer layers," Optical Engineering 55(11), 117106 (30 November 2016). https://doi.org/10.1117/1.OE.55.11.117106

Published: 30 November 2016

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available