Materials, Photonic Devices, and Sensors

Analysis of the resonant layer effect in multilayer nanostructured optical waveguides

[+] Author Affiliations
Douglas B. O. Fonseca, Maria A. G. Martinez

Centro Federal de Educação Tecnológica Celso Suckow da Fonseca, Photonics Lab, Department of Electrical Engineering, Avenida Maracanã, 229, Rio de Janeiro 20271-110, Brazil

Maria T. M. R. Giraldi

Instituto Militar de Engenharia, Photonics Lab, Department of Electrical Engineering, Praça General Tibúrcio, 80, Rio de Janeiro 22290-270, Brazil

Opt. Eng. 56(1), 017109 (Jan 25, 2017). doi:10.1117/1.OE.56.1.017109
History: Received September 17, 2016; Accepted January 4, 2017
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Abstract.  The resonant layer effect (RLE) is investigated for a multilayer structure with iron nanoinclusions. The RLE tuning and strength are analyzed as a function of nanoinclusion filling factor and resonant, cladding and guiding layers thicknesses. Crossing, splitting, and quasidegeneration of modes in the structure dispersion diagram are discussed, along with its relation to the RL effect detuning and structure-coupling regime. For the range of parameters considered, multiple resonances are tunable in the multilayer structure. Optimized RLE TE and TM polarizers are proposed for operation at 1550 nm based on modal loss and field confinement calculations. For the TE-pass polarizer, a 201.1-dB rejection ratio and 3.85-dB/cm insertion loss are obtained, while for the TM-pass polarizer, a 95.6-dB rejection ratio and 4.41-dB/cm insertion loss are achieved.

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© 2017 Society of Photo-Optical Instrumentation Engineers

Citation

Douglas B. O. Fonseca ; Maria A. G. Martinez and Maria T. M. R. Giraldi
"Analysis of the resonant layer effect in multilayer nanostructured optical waveguides", Opt. Eng. 56(1), 017109 (Jan 25, 2017). ; http://dx.doi.org/10.1117/1.OE.56.1.017109


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