Instrumentation, Techniques, and Measurement

Accurate carrier-removal method for interferogram analysis

[+] Author Affiliations
Bin Lan, Guoying Feng, Tao Zhang

Institute of Laser & Micro/Nano Engineering, College of Electronics & Information Engineering, Sichuan University, Chengdu, Sichuan, China

Shouhuan Zhou

Institute of Laser & Micro/Nano Engineering, College of Electronics & Information Engineering, Sichuan University, Chengdu, Sichuan, China

North China Research Institute of Electro-Optics, Beijing, China

Opt. Eng. 56(3), 034101 (Mar 02, 2017). doi:10.1117/1.OE.56.3.034101
History: Received June 27, 2016; Accepted January 17, 2017
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Abstract.  Based on zero-padding and frequency-domain self-filtering, a robust and effective spectrum centroid carrier-removal method for carrier interferogram analysis is proposed. The interferogram is first spatial zero padded to increase the frequency resolution, and then the frequency domain self-filtering is carried out to suppress the noise and enhance the carrier component. Finally, the carrier frequencies are estimated by calculating the spectral centroid of the upside lobe. The simulations and experiments are carried out to testify the feasibility of this method. In addition, some factors, such as the carrier frequency values, the level of random noise, and the window size of the spectral filter, are analyzed and discussed. Compared with existing carrier-removal methods, the proposed method is effective and accurate for suppressing the carrier-removal error.

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© 2017 Society of Photo-Optical Instrumentation Engineers

Citation

Bin Lan ; Guoying Feng ; Tao Zhang and Shouhuan Zhou
"Accurate carrier-removal method for interferogram analysis", Opt. Eng. 56(3), 034101 (Mar 02, 2017). ; http://dx.doi.org/10.1117/1.OE.56.3.034101


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