Imaging Components, Systems, and Processing

Analysis and reduction of phase errors caused by nonuniform surface reflectivity in a phase-shifting measurement system

[+] Author Affiliations
Songlin Chen, Hongyao Zhang, Maobang Hu

Chinese Academy of Sciences, Shenyang Institute of Automation, State Key Laboratory of Robotics, Shenyang, China

University of Chinese Academy of Sciences, Beijing, China

Renbo Xia, Jibin Zhao

Chinese Academy of Sciences, Shenyang Institute of Automation, State Key Laboratory of Robotics, Shenyang, China

Opt. Eng. 56(3), 033102 (Mar 03, 2017). doi:10.1117/1.OE.56.3.033102
History: Received October 27, 2016; Accepted February 9, 2017
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Abstract.  The measurement accuracy of a phase-shifting measurement system is adversely affected by phase errors. This paper presents a theoretical analysis of phase errors caused by nonuniform surface reflectivity, such as varying reflectivity and a sharp change in reflectivity. Based on the analysis, a method to adaptively adjust the maximum input gray level of each pixel in projected fringe patterns to the local reflectivity was proposed to reduce phase errors. Experimental results for a planar checkerboard show that the measurement error can be reduced by 56.6% by using the proposed method.

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© 2017 Society of Photo-Optical Instrumentation Engineers

Citation

Songlin Chen ; Renbo Xia ; Jibin Zhao ; Hongyao Zhang and Maobang Hu
"Analysis and reduction of phase errors caused by nonuniform surface reflectivity in a phase-shifting measurement system", Opt. Eng. 56(3), 033102 (Mar 03, 2017). ; http://dx.doi.org/10.1117/1.OE.56.3.033102


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