Errata

Errata: Model for thickness dependence of mobility and concentration in highly conductive zinc oxide

[+] Author Affiliations
David C. Look

Wright State University, Semiconductor Research Center, Dayton, Ohio

Aerospace Division, Wyle Laboratories, Dayton, Ohio

Sensors Directorate, Air Force Research Laboratory, Dayton, Ohio

Kevin D. Leedy, Arnold Kiefer, Bruce Claflin

Sensors Directorate, Air Force Research Laboratory, Dayton, Ohio

Naho Itagaki, Koichi Matsushima, Iping Suhariadi

Kyushu University, Department of Information Science and Electrical Engineering, Fukuoka, Japan

Opt. Eng. 56(4), 049801 (Apr 04, 2017). doi:10.1117/1.OE.56.4.049801
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This article [Opt. Eng.52(3), 033801 (2013)] was originally published on 13 March 2013 with an error in the author list. The last author’s name was misspelled “Surhariadi.” The correct spelling appears above.

The paper was corrected on 23 March 2017.

© 2017 Society of Photo-Optical Instrumentation Engineers

Citation

David C. Look ; Kevin D. Leedy ; Arnold Kiefer ; Bruce Claflin ; Naho Itagaki, et al.
"Errata: Model for thickness dependence of mobility and concentration in highly conductive zinc oxide", Opt. Eng. 56(4), 049801 (Apr 04, 2017). ; http://dx.doi.org/10.1117/1.OE.56.4.049801


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