Lasers, Fiber Optics, and Communications

Spatial carrier color digital speckle pattern interferometry for absolute three-dimensional deformation measurement

[+] Author Affiliations
Xinya Gao, Yonghong Wang, Xizuo Dan

Hefei University of Technology, School of Instrument Science and Opto-Electronics Engineering, Hefei, China

Junrui Li

Oakland University, Department of Mechanical Engineering, Rochester, Michigan, United States

Sijin Wu

Beijing Information Science and Technology University, Department of Measurement-Control Technology and Instrumentation, Beijing, China

Lianxiang Yang

Hefei University of Technology, School of Instrument Science and Opto-Electronics Engineering, Hefei, China

Oakland University, Department of Mechanical Engineering, Rochester, Michigan, United States

Beijing Information Science and Technology University, Department of Measurement-Control Technology and Instrumentation, Beijing, China

Opt. Eng. 56(6), 066107 (Jun 15, 2017). doi:10.1117/1.OE.56.6.066107
History: Received March 7, 2017; Accepted May 22, 2017
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Abstract.  It is difficult to measure absolute three-dimensional deformation using traditional digital speckle pattern interferometry (DSPI) when the boundary condition of an object being tested is not exactly given. In practical applications, the boundary condition cannot always be specifically provided, limiting the use of DSPI in real-world applications. To tackle this problem, a DSPI system that is integrated by the spatial carrier method and a color camera has been established. Four phase maps are obtained simultaneously by spatial carrier color-digital speckle pattern interferometry using four speckle interferometers with different illumination directions. One out-of-plane and two in-plane absolute deformations can be acquired simultaneously without knowing the boundary conditions using the absolute deformation extraction algorithm based on four phase maps. Finally, the system is proved by experimental results through measurement of the deformation of a flat aluminum plate with a groove.

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© 2017 Society of Photo-Optical Instrumentation Engineers

Citation

Xinya Gao ; Yonghong Wang ; Junrui Li ; Xizuo Dan ; Sijin Wu, et al.
"Spatial carrier color digital speckle pattern interferometry for absolute three-dimensional deformation measurement", Opt. Eng. 56(6), 066107 (Jun 15, 2017). ; http://dx.doi.org/10.1117/1.OE.56.6.066107


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