Instrumentation, Techniques, and Measurement

Scatter measurement and correction method for cone-beam CT based on single grating scan

[+] Author Affiliations
Kuidong Huang, Wenlong Shi, Xinyu Wang, Dinghua Zhang

Northwestern Polytechnical University, Key Laboratory of Contemporary Design and Integrated Manufacturing Technology of the Education Ministry of China, Xi’an, China

Yin Dong, Taoqi Chang

CAPC Xi’an Precision Casting Co., Ltd., Xi’an, China

Hua Zhang

Northwestern Polytechnical University, School of Mechanical Engineering, Xi’an, China

Opt. Eng. 56(6), 064106 (Jun 29, 2017). doi:10.1117/1.OE.56.6.064106
History: Received February 13, 2017; Accepted June 13, 2017
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Abstract.  In cone-beam computed tomography (CBCT) systems based on flat-panel detector imaging, the presence of scatter significantly reduces the quality of slices. Based on the concept of collimation, this paper presents a scatter measurement and correction method based on single grating scan. First, according to the characteristics of CBCT imaging, the scan method using single grating and the design requirements of the grating are analyzed and figured out. Second, by analyzing the composition of object projection images and object-and-grating projection images, the processing method for the scatter image at single projection angle is proposed. In addition, to avoid additional scan, this paper proposes an angle interpolation method of scatter images to reduce scan cost. Finally, the experimental results show that the scatter images obtained by this method are accurate and reliable, and the effect of scatter correction is obvious. When the additional object-and-grating projection images are collected and interpolated at intervals of 30 deg, the scatter correction error of slices can still be controlled within 3%.

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© 2017 Society of Photo-Optical Instrumentation Engineers

Citation

Kuidong Huang ; Wenlong Shi ; Xinyu Wang ; Yin Dong ; Taoqi Chang, et al.
"Scatter measurement and correction method for cone-beam CT based on single grating scan", Opt. Eng. 56(6), 064106 (Jun 29, 2017). ; http://dx.doi.org/10.1117/1.OE.56.6.064106


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