High sensitivity speckle metrology

Morgan Facchin; Kishan Dholakia; Graham D. Bruce

doi:10.1117/12.2650217

17 March 2023 High sensitivity speckle metrology

Morgan Facchin, Kishan Dholakia, Graham D. Bruce

Proceedings Volume PC12436, Complex Light and Optical Forces XVII; PC124360B (2023) https://doi.org/10.1117/12.2650217
Event: SPIE OPTO, 2023, San Francisco, California, United States

Abstract

Speckle, the granular interference pattern produced when coherent light is scattered by a rough surface, is commonly thought to be detrimental to optical systems. But the scattering processes are entirely linear, and speckle can therefore be used as a surprisingly sensitive probe of the properties of the light, the environment and the scatterer. We review current progress in measuring the wavelength, polarisation and topological charge of the light; the refractive index of the environment; and displacement of the scattering surface. In particular, we show how the sensitivity can be optimised by tailoring the scattering geometry and input light field.

Conference Presentation

Citation Download Citation

Morgan Facchin, Kishan Dholakia, and Graham D. Bruce "High sensitivity speckle metrology", Proc. SPIE PC12436, Complex Light and Optical Forces XVII, PC124360B (17 March 2023); https://doi.org/10.1117/12.2650217

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