Performance Characteristics Of A Producible NTSC-Compatible Charge-Coupled Device (CCD) Image Sensor

Howard E. Murphy

doi:10.1117/12.958128

12 December 1979 Performance Characteristics Of A Producible NTSC-Compatible Charge-Coupled Device (CCD) Image Sensor

Howard E. Murphy

Proceedings Volume 0203, Recent Advances in TV Sensors and Systems; (1979) https://doi.org/10.1117/12.958128
Event: 23rd Annual Technical Symposium, 1979, San Diego, United States

Abstract

Brief reviews of the structure and normal operating conditions for manufactured versions of 488 by 380 element CCD image sensors are followed by descriptions of the performance available from typical devices and by description of common types of cosmetic blemishes which limit the yield of production sensors. The 488 by 380 element sensors are fabricated by buried channel CCD technology. They utilize an interline transfer technique to achieve a high CTF at Nyquist frequencies, which results in crisp imagery from reasonable die areas. The sensors also offer wide dynamic range, good low light level capability, and compatibility with NTSC quality requirements.

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Howard E. Murphy "Performance Characteristics Of A Producible NTSC-Compatible Charge-Coupled Device (CCD) Image Sensor", Proc. SPIE 0203, Recent Advances in TV Sensors and Systems, (12 December 1979); https://doi.org/10.1117/12.958128

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