Characterization Of PLZT For Holographic Mode SLM Applications

Sylvia D. Mancha; Christopher R. DeHainaut; Robert W. Carter; Jeff A . Bullington; Jeff A. Poston; Richard L. Mills

doi:10.1117/12.941989

19 February 1988 Characterization Of PLZT For Holographic Mode SLM Applications

Sylvia D. Mancha, Christopher R. DeHainaut, Robert W. Carter, Jeff A . Bullington, Jeff A. Poston, Richard L. Mills

Proceedings Volume 0825, Spatial Light Modulators and Applications II; (1988) https://doi.org/10.1117/12.941989
Event: 31st Annual Technical Symposium on Optical and Optoelectronic Applied Sciences and Engineering, 1987, San Diego, CA, United States

Abstract

An experiment was performed to demonstrate the holographic phase conjugation characteristics of a PLZT Integrated Spatial Light Modulator (ISLM) device. The ISLM was addressed with angularly separated reference and object beams. The aberrations of a colli-mated laser beam were stored in an ion-implanted sample of antiferroelectric (AFF) phase PLZT in the form of a fringe pattern resulting from the interference of the object beam with the reference beam. The angle of incidence between the beams was 0.4° and resulted in a resolution of approximately 15 line pairs per millimeter. The -1 diffracted order was directed back through the path of the object beam and the aberrations were cancelled. It was concluded that AFE-phase PLZT has sufficient diffraction efficiency for phase conjugation at higher resolutions which result from addressing with angularly separated beams.

Citation Download Citation

Sylvia D. Mancha, Christopher R. DeHainaut, Robert W. Carter, Jeff A . Bullington, Jeff A. Poston, and Richard L. Mills "Characterization Of PLZT For Holographic Mode SLM Applications", Proc. SPIE 0825, Spatial Light Modulators and Applications II, (19 February 1988); https://doi.org/10.1117/12.941989

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KEYWORDS

Holography

Phase conjugation

Ceramics

Diffraction

Polarization

Camera shutters

Fringe analysis

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