Paper
21 March 1989 Instrumental Effects In Surface Finish Measurement
E. L. Church, P. Z. Takacs
Author Affiliations +
Proceedings Volume 1009, Surface Measurement and Characterization; (1989) https://doi.org/10.1117/12.949154
Event: 1988 International Congress on Optical Science and Engineering, 1988, Hamburg, Germany
Abstract
The derivation of surface-finish statistics from profile measurements are reviewed with emphasis on the corrections and limitations imposed by the measurement process itself. These issues are important for the comparison of the results of different types of measurements, connecting results with functional surface properties, and evaluating different finishing techniques.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
E. L. Church and P. Z. Takacs "Instrumental Effects In Surface Finish Measurement", Proc. SPIE 1009, Surface Measurement and Characterization, (21 March 1989); https://doi.org/10.1117/12.949154
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Cited by 22 scholarly publications.
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KEYWORDS
Surface finishing

Statistical analysis

Signal processing

Spatial frequencies

Filtering (signal processing)

Microscopy

Electronic filtering

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