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Interferometers are widely used for measuring the profiles of 'super-smooth' surfaces. The most sensitive of these instruments employ a 'common-path' design with the two interfering beams being reflected from different areas of the test surface, making the interferometer insensitive to vertical motion of the surface. When these systems are applied to the measurement of surface 'roughness' the shortest surface wavelength that can be measured depends upon both the wavelength of the measurement radiation and the numerical aperture of the probe beam optics. The longest surface wavelength depends upon the optical configuration of the interferometer. A profiling interferometer will be briefly described that has a sensitivity to surface height of better than 0.01 nm and a surface wavelength range from 0.5 to 15 micrometres. The results of measurements on a number of surfaces using this instrument will be shown and the methods used for analysing these will be discussed.
M. J. Downs,N. M. Mason, andJ. C. C. Nelson
"Measurement Of The Profiles Of 'Super-Smooth' Surfaces Using Optical Interferometry", Proc. SPIE 1009, Surface Measurement and Characterization, (21 March 1989); https://doi.org/10.1117/12.949149
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M. J. Downs, N. M. Mason, J. C. C. Nelson, "Measurement Of The Profiles Of 'Super-Smooth' Surfaces Using Optical Interferometry," Proc. SPIE 1009, Surface Measurement and Characterization, (21 March 1989); https://doi.org/10.1117/12.949149