A hyperspectral scanning microscope system for phenomenology support

Paul G. Lucey; Jessica Norman; Sarah T. Crites

doi:10.1117/12.2262421

3 May 2017 A hyperspectral scanning microscope system for phenomenology support

Paul G. Lucey, Jessica Norman, Sarah T. Crites

Proceedings Volume 10210, Next-Generation Spectroscopic Technologies X; 102100K (2017) https://doi.org/10.1117/12.2262421
Event: SPIE Commercial + Scientific Sensing and Imaging, 2017, Anaheim, CA, United States

Abstract

Three hyperspectral imaging systems have been implemented as microscopic hyperspectral imagers to support phenomenology studies at high spatial resolution. Wavelength ranges are VNIR (500 to 1000 nm), SWIR (1000 nm to 2500 nm) and LWIR (7 to 14 microns). The spatial resolution of the system at all wavelengths is 30 microns and covers a field of view of 8x30 mm. Samples are illuminated by rings of halogen lights and IR emitters for reflectance measurements and at thermal wavelengths can also be measured in thermal emission. Data are calibrated by scans of gold or Spectralon reflectance standards, and a flat plate blackbody for thermal emission measurements.

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Citation Download Citation

Paul G. Lucey, Jessica Norman, and Sarah T. Crites "A hyperspectral scanning microscope system for phenomenology support", Proc. SPIE 10210, Next-Generation Spectroscopic Technologies X, 102100K (3 May 2017); https://doi.org/10.1117/12.2262421

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