Paper
30 December 2016 Effective optical constants of silver nanofilms calculated in wide frequency range
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Proceedings Volume 10224, International Conference on Micro- and Nano-Electronics 2016; 1022408 (2016) https://doi.org/10.1117/12.2267083
Event: The International Conference on Micro- and Nano-Electronics 2016, 2016, Zvenigorod, Russian Federation
Abstract
The optical properties of Ag ultrathin films in dependence of their thickness are studied theoretically in a wavelength range 0.3 - 10 μm. The extinction coefficient (k) and refractive index (n) for thin Ag films with smooth surface structure are calculated with software package VASP. It was found the effect of growth of extinction coefficient and shift of its peak into long wavelength range with the thickness increasing. The effect is explained by the significant increasing of the surface electron states. Refractive index n is increased with the wavelength growth and attains saturation value ns at the wavelength λs. The thicker the films the higher the magnitude of ns and the larger the wavelength λs. Our results of calculations of k(λ) are in a good agreement with experimental data from ref.[25]. The difference in magnitudes of n obtained experimentally and theoretically can be explained by the formation of Ag nanoclusters on the surface of sputtered film.
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Kseniya M. Tsysar, Valery G. Andreev, and Vladimir A. Vdovin "Effective optical constants of silver nanofilms calculated in wide frequency range", Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022408 (30 December 2016); https://doi.org/10.1117/12.2267083
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KEYWORDS
Silver

Refractive index

Dielectrics

Thin films

Metals

Infrared radiation

Dendrites

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