A high resolution hand-held focused beam profiler

J. Zapata-Farfan; J. Garduño-Mejía; M. Rosete-Aguilar; G. Ascanio; C. J. Román-Moreno

doi:10.1117/12.2264707

16 May 2017 A high resolution hand-held focused beam profiler

J. Zapata-Farfan, J. Garduño-Mejía, M. Rosete-Aguilar, G. Ascanio, C. J. Román-Moreno

Proceedings Volume 10231, Optical Sensors 2017; 102311F (2017) https://doi.org/10.1117/12.2264707
Event: SPIE Optics + Optoelectronics, 2017, Prague, Czech Republic

Abstract

The shape of a beam is important in any laser application and depending on the final implementation, there exists a preferred one which is defined by the irradiance distribution.¹ The energy distribution (or laser beam profile) is an important parameter in a focused beam, for instance, in laser cut industry, where the beam shape determines the quality of the cut. In terms of alignment and focusing, the energy distribution also plays an important role since the system must be configured in order to reduce the aberration effects and achieve the highest intensity. Nowadays a beam profiler is used in both industry and research laboratories with the aim to characterize laser beams used in free-space communications, focusing and welding, among other systems. The purpose of the profile analyzers is to know the main parameters of the beam, to control its characteristics as uniformity, shape and beam size as a guide to align the focusing system. In this work is presented a high resolution hand-held and compact design of a beam profiler capable to measure at the focal plane, with covered range from 400 nm to 1000 nm. The detection is reached with a CMOS sensor sized in 3673.6 μm x 2738.4 μm which acquire a snap shot of the previously attenuated focused beam to avoid the sensor damage, the result is an image of beam intensity distribution, which is digitally processed with a RaspberryTMmodule gathering significant parameters such as beam waist, centroid, uniformity and also some aberrations. The profiler resolution is 1.4 μm and was probed and validated in three different focusing systems. The spot sizes measurements were compared with the Foucault knife-edge test.

Citation Download Citation

J. Zapata-Farfan, J. Garduño-Mejía, M. Rosete-Aguilar, G. Ascanio, and C. J. Román-Moreno "A high resolution hand-held focused beam profiler", Proc. SPIE 10231, Optical Sensors 2017, 102311F (16 May 2017); https://doi.org/10.1117/12.2264707

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available