Paper
28 July 2017 Development of a wearable CMOS-based contact imaging system for real-time skin condition diagnosis
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Abstract
Diffuse reflectance spectroscopy has been widely used in the field of biological tissue characterization with various modalities [1-5,6]. One of these modalities consists in measuring the spatially resolved diffuse reflectance (SRDR). In this technique, light is collected at multiple distances from the excitation point. The obtained reflectance decay curve is used to determine scattering and absorption properties of the tissue [7], which are directly related to tissue content and structure. Existing systems usually use fiber optics to collect light reflected from the tissue and transfer it to an optical sensor [1,6]. Such devices make it possible to perform SRDR measurements directly in contact with the tissue. However, they offer poor spatial sampling of the reflectance and low light collection efficiency. We propose to overcome these limitations by using a CMOS sensor placed in contact with the tissue to achieve light collection with high spatial sampling over several millimeters and with increased fill factor. Our objective in this paper is to demonstrate the potential of our instrument to determine the optical properties of tissues from SRDR measurements. We first describe the instrument and the employed methodology. Then, preliminary results obtained on optical phantoms are presented. Finally, the potential of our system for SRDR measurements is evaluated through comparison with a fiber-optic probe previously developed in our laboratory [6,8].
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nils Petitdidier, Anne Koenig, Rémi Gerbelot, Sylvain Gioux, and Jean-Marc Dinten "Development of a wearable CMOS-based contact imaging system for real-time skin condition diagnosis", Proc. SPIE 10412, Diffuse Optical Spectroscopy and Imaging VI, 104120F (28 July 2017); https://doi.org/10.1117/12.2285998
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Cited by 3 patents.
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KEYWORDS
Skin

CMOS sensors

Diffuse reflectance spectroscopy

Imaging systems

Optical sensors

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