Paper
7 August 2017 Influence of structural disorder on the optical properties of non-stoichiometric Cu6Ps5I-based thin films
Ihor Studenyak, Vitalii Izai, Viktor Studenyak, Andrij Bendak, Mladen Kranjčec, Peter Kúš, Marian Mikula, Branislav Grančič, Tomaš Roch, Batyrbek Suleimenov, Tomasz Ławicki, Egor Gurov
Author Affiliations +
Proceedings Volume 10445, Photonics Applications in Astronomy, Communications, Industry, and High Energy Physics Experiments 2017; 104454Z (2017) https://doi.org/10.1117/12.2280742
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2017, 2017, Wilga, Poland
Abstract
Cu6PS5I-based thin films were deposited onto silicate glass substrates by magnetron sputtering. Chemical composition of the thin films was determined by energy-dispersive X-ray spectroscopy. With increasing Cu content, a red shift of the exponential absorption edge energy position as well as a decrease of the Urbach energy are observed. Optical transmission spectra of Cu8.05P0.68S3.54I0.73 thin film were investigated in the temperature interval 77–300 K; the temperature behaviour of the optical absorption spectra and the refractive index dispersion was studied. Temperature dependences of the energy position of the absorption edge, the Urbach energy, and the refractive index of the Cu8.05P0.68S3.54I0.73 thin film were analysed. The influence of structural disorder on the optical properties of the Cu6PS5Ibased thin films is discussed.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ihor Studenyak, Vitalii Izai, Viktor Studenyak, Andrij Bendak, Mladen Kranjčec, Peter Kúš, Marian Mikula, Branislav Grančič, Tomaš Roch, Batyrbek Suleimenov, Tomasz Ławicki, and Egor Gurov "Influence of structural disorder on the optical properties of non-stoichiometric Cu6Ps5I-based thin films", Proc. SPIE 10445, Photonics Applications in Astronomy, Communications, Industry, and High Energy Physics Experiments 2017, 104454Z (7 August 2017); https://doi.org/10.1117/12.2280742
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KEYWORDS
Thin films

Copper

Absorption

Picosecond phenomena

Refractive index

Optical properties

Transmittance

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