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22 August 2017 THz metrology for active electronic devices: state of the art and challenges
Mira Naftaly
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Proceedings Volume 10453, Third International Conference on Applications of Optics and Photonics; 104532Z (2017) https://doi.org/10.1117/12.2276354
Event: Third International Conference on Applications of Optics and Photonics, 2017, Faro, Portugal
Abstract
The area of terahertz science and applications has grown dramatically in the last 30 years. Instrumental platforms for THz measurements have also proliferated, and now include laser-based, electronic, opto-electronic, and microwave photonics devices. As the field matured, metrology and standardization have gained focused attention, resulting in an increasing number of publications and a book devoted to the subject. However, these have been primarily focused on photonic-based free-space techniques and their particular demands and issues. This paper presents a brief review of metrology requirements for active THz electronic devices, the available instrumentation, state of the art, and challenges.
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Mira Naftaly "THz metrology for active electronic devices: state of the art and challenges", Proc. SPIE 10453, Third International Conference on Applications of Optics and Photonics, 104532Z (22 August 2017); https://doi.org/10.1117/12.2276354
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KEYWORDS
Metrology
Terahertz radiation
Calibration
Optoelectronics
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