Presentation
14 March 2018 3D-additive manufacturing non-destructive characterization with terahertz waves (Conference Presentation)
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Abstract
sequences. Sizing, surface and volume rendering can be extracted and compared with targeted dimensions. In this work, we use millimeter wave systems tomographic system (100 and 300 GHz), frequency modulated systems (100 and 300 GHz), and pulse time domain systems (100 GHz to 4 THz) for non destructive characterization of 3D printed additive manufacturing parts. The aim of this talk to to show the advantages and disadvantages of several techniques to define their application aera. This work is associated to a data processing analysis using automated segmentation, extracting of the different volumes of interest (VOI) composing the sample. A mesh is performed for each VOI to numerically calculate the dimensions, surfaces and volume which leads to 3D visualization and dimensional measurements. Overall sequence is implemented onto unique software and validated through different sample analysis.
Conference Presentation
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Jean-Paul Guillet, Anne-Françoise Obaton, Jean Baptiste Perraud, Hugo Balacey, Benoit Recur, and Patrick Mounaix "3D-additive manufacturing non-destructive characterization with terahertz waves (Conference Presentation)", Proc. SPIE 10531, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XI, 105310Q (14 March 2018); https://doi.org/10.1117/12.2290393
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KEYWORDS
Imaging systems

Tomography

Additive manufacturing

Data processing

Extremely high frequency

Millimeter wave imaging

Modulation

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