Slow light effect analysis excited by plasmon-induced transparency in metal-dielectric-metal waveguide

Gui Jin; Xiaoyi Huang

doi:10.1117/12.2309283

20 February 2018 Slow light effect analysis excited by plasmon-induced transparency in metal-dielectric-metal waveguide

Gui Jin, Xiaoyi Huang

Proceedings Volume 10697, Fourth Seminar on Novel Optoelectronic Detection Technology and Application; 106974J (2018) https://doi.org/10.1117/12.2309283
Event: Fourth Seminar on Novel Optoelectronic Detection Technology and Application, 2017, Nanjing, China

Abstract

We propose and demonstrate a metal-dielectric-metal(MDM) waveguide side coupled with two stubs to realize plasmon induced transparency (PIT) effect. The dispersion relation of the structure has been plotted by solving the dispersion equation of MDM three layer structure, the transmission spectrum is investigated by coupled mode theory (CMT) and Finite Element Method (FEM) simulation, the CMT results can. The surface plasmon device can also be used as a EIT-like filter with a variable full width of half-maximum (FWHM) and highest transmission over 88%. The maximum group index n_g is 42 with a group velocity of 0.023ܿ and transmission of 48%, The normalized delay-bandwidth product (NDBP) can be modulated through changing the gap width of resonators and waveguide bus, the highest is 0.641 at gap width 10 nm, and lowest is 0.246 at 30 nm. The dispersion of group velocity (GVD) changes drastically at narrow gap width and becomes more and more flat at broader gap width, this opens up an avenue for designing optical buffers, switches and modulators.

Citation Download Citation

Gui Jin and Xiaoyi Huang "Slow light effect analysis excited by plasmon-induced transparency in metal-dielectric-metal waveguide", Proc. SPIE 10697, Fourth Seminar on Novel Optoelectronic Detection Technology and Application, 106974J (20 February 2018); https://doi.org/10.1117/12.2309283

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