Paper
7 September 2018 Using spatial light modulator for correction of wavefront reflected from optically rough surface
Author Affiliations +
Proceedings Volume 10834, Speckle 2018: VII International Conference on Speckle Metrology; 108341D (2018) https://doi.org/10.1117/12.2318705
Event: SPECKLE 2018: VII International Conference on Speckle Metrology, 2018, Janów Podlaski, Poland
Abstract
We present an experimental study of the method using a spatial light modulator for correction of the wavefront reflected from the optically rough surface. This method is based on the detection of the mutual phase differences between different regions of the wavefront that correspond to the constructive interference. We study the capabilities of this method from the metrological point of view for the ground glass samples characterized by several different levels of roughness. The resulting wavefront correction is tested in dependence on the measurement parameters settings and is verified by analyzing two specific patterns generated by the spatial light modulator.
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Martin Šarbort, Šimon Řeřucha, Tomáš Fořt, Tomáš Pikálek, Miroslava Holá, Jindřich Oulehla, and Josef Lazar "Using spatial light modulator for correction of wavefront reflected from optically rough surface", Proc. SPIE 10834, Speckle 2018: VII International Conference on Speckle Metrology, 108341D (7 September 2018); https://doi.org/10.1117/12.2318705
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KEYWORDS
Wavefronts

Spatial light modulators

Computer generated holography

Adaptive optics

Glasses

Phase measurement

Diffraction

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