Paper
18 January 2019 Study of wavefront reconstruction based on four-wave lateral shear interferometer method
Wenbo Wan, Lihong Yang, Junhong Su
Author Affiliations +
Proceedings Volume 10839, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment; 108391C (2019) https://doi.org/10.1117/12.2506493
Event: Ninth International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT2018), 2018, Chengdu, China
Abstract
Shear interferometer measurement method is one of main techniques in optical interferometry metrology. A shearing interferometric detection system is presented in order to obtain the three- dimensional profile of wavefront. A aperture and chessboard grating were used to divide the measured wavefront into four wavefronts, and two coherent wavefronts form an interferogram. The theoretical model of shearing interferometric detection system based on Fourier Optics and light intensity transmission equation is structured. According to the Fourier transform algorithm, an algorithm of shear interferogram processing is presented. Finally, the measured wavefront can be reconstructed. The transient wavefront detection system was applied to reconstruct the transient wavefront automatically. Experiments show that the apparatus offers higher accuracy, which satisfies the need for the practical applications. The measured results are in good agreement with the reconstructed wavefronts from SID4 wavefront sensor. The system can be applied to transient wavefront reconsitution.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wenbo Wan, Lihong Yang, and Junhong Su "Study of wavefront reconstruction based on four-wave lateral shear interferometer method", Proc. SPIE 10839, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 108391C (18 January 2019); https://doi.org/10.1117/12.2506493
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KEYWORDS
Wavefronts

Charge-coupled devices

Interferometry

Calibration

Wavefront reconstruction

Interferometers

Diffraction

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