Presentation + Paper
4 March 2019 Impact of external optical feedback on high-power diode laser lifetime and failure modes
Author Affiliations +
Proceedings Volume 10900, High-Power Diode Laser Technology XVII; 109000S (2019) https://doi.org/10.1117/12.2509845
Event: SPIE LASE, 2019, San Francisco, California, United States
Abstract
We present results of investigations on high-power diode lasers in the spectral range between 780 nm and 1060 nm with different antireflection coatings at the outcoupling facet. Comparative life tests on high-power laser bars and single emitters with and without external optical feedback delivered significantly different results. Depending on the emission wavelength, we found different degradation rates and failure modes such as accelerated gradual degradation and catastrophic optical mirror damage caused by different energy reabsorption scenarios with respect to the energy gap of the device substrate material. We will also show different impacts of general and wavelength selective feedback on the near-field distribution.
Conference Presentation
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Heiko Kissel, Jens W. Tomm, Bernd Köhler, and Jens Biesenbach "Impact of external optical feedback on high-power diode laser lifetime and failure modes", Proc. SPIE 10900, High-Power Diode Laser Technology XVII, 109000S (4 March 2019); https://doi.org/10.1117/12.2509845
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CITATIONS
Cited by 1 scholarly publication.
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KEYWORDS
Semiconductor lasers

High power lasers

Absorption

Antireflective coatings

Waveguides

Diodes

Quantum wells

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