Paper
31 December 2018 Transmission spectra modeling for nanomultilayer chalcogenide thin films
Alexei Meshalkin, Oleksandr Paiuk, Elena Achimova, Alexander Stronski
Author Affiliations +
Proceedings Volume 10977, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IX; 109770F (2018) https://doi.org/10.1117/12.2324795
Event: Advanced Topics in Optoelectronics, Microelectronics and Nanotechnologies IX, 2018, Constanta, Romania
Abstract
An curve-fitting method for accurate determination of optical constants and thickness is presented for chalcogenide glasses thin films. Optical constants and thickness of nanomultilayer chalcogenide structure As2S3:Mn-Se were obtained by Swanepoel method from transmission spectrum using PARAV software. Proposed curve-fitting method is based on numerical simulation of transmission spectrum based on film parameters obtained by Swanepoel method and comparison one with experimental transmission spectrum. It is shown that modeled spectrum is not fully corresponding to the original measured spectrum due to inaccurate absorption coefficient determination in the region of Urbach absorption. Adjusting of absorption spectrum with further numerical simulation of spectrum allows achieving the best correspondence to original transmission spectrum. It solves the problem of the accurate absorption coefficient calculation in the different absorption regions. Finally, dependencies of the absorption coefficient on wavelength of the nanomultilayer chalcogenide films structures were obtained from transmission spectra using the proposed method.
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Alexei Meshalkin, Oleksandr Paiuk, Elena Achimova, and Alexander Stronski "Transmission spectra modeling for nanomultilayer chalcogenide thin films", Proc. SPIE 10977, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IX, 109770F (31 December 2018); https://doi.org/10.1117/12.2324795
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KEYWORDS
Absorption

Transmittance

Thin films

Chalcogenides

Refractive index

Dispersion

Optical properties

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