Non-destructive analysis of manufacturing defects for building materials

Adrian Tulbure; Gheorghe Marc

doi:10.1117/12.2326484

31 December 2018 Non-destructive analysis of manufacturing defects for building materials

Adrian Tulbure, Gheorghe Marc

Proceedings Volume 10977, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IX; 109770Z (2018) https://doi.org/10.1117/12.2326484
Event: Advanced Topics in Optoelectronics, Microelectronics and Nanotechnologies IX, 2018, Constanta, Romania

Abstract

The paper presents an applicative set-up for quality control of a concrete tiles manufacturing line. The quality control is performed by optical inspection using Labview and Vision builder.

The tiles optical control intends to detect the correctness of the objects following two parameters: the colour and the geometrical dimensions. We used MyRIO - a real-time embedded evaluation board made by National Instruments [2] for the tile diagnosis.

Citation Download Citation

Adrian Tulbure and Gheorghe Marc "Non-destructive analysis of manufacturing defects for building materials", Proc. SPIE 10977, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IX, 109770Z (31 December 2018); https://doi.org/10.1117/12.2326484

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