Paper
7 March 2019 Dependence of micro-morphology of electrical strain gauges on stress distribution
Zhigang Wang, Chi Xiao, Yunlong Mao, Yinming Zhao, Zili Zhou, Yongqian Li
Author Affiliations +
Proceedings Volume 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation; 110532U (2019) https://doi.org/10.1117/12.2512044
Event: 10th International Symposium on Precision Engineering Measurements and Instrumentation (ISPEMI 2018), 2018, Kunming, China
Abstract
We investigated the determinations by the micro-morphology of the sensitive grids of resistance strain gauge on their stress distributions. The micro-morphologies of the sidewalls for four typical resistance strain gauges were observed by scanning electron microscopy (SEM), and then the microscopic images were binarized to obtain the micromorphological characteristics of the sensitive grids. The observation shows that the sidewalls of the sensitive grids have periodic microstructures. A geometrical model of sinusoidal contour and a strain transfer model was established following the observed micro-morphological features. The influence of the amplitude and period parameters of the sinusoidal contour on the stress level of the sensitive grid was calculated numerically. The results show that the maximum stress increases, however the average stress decreases, with the increase of the profile amplitude with a certain periodicity. For a sinusoidal profile having a fixed amplitude, its maximum stress decreases with the increase of the cycle, wherever the average stress increases. The smaller side wall defects and longer interval in a sensitive grid would make the stress distribution more uniform. The obtained results would provide guidance for the fabrication of the resistance strain gauge.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhigang Wang, Chi Xiao, Yunlong Mao, Yinming Zhao, Zili Zhou, and Yongqian Li "Dependence of micro-morphology of electrical strain gauges on stress distribution", Proc. SPIE 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation, 110532U (7 March 2019); https://doi.org/10.1117/12.2512044
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KEYWORDS
Resistance

Adhesives

Scanning electron microscopy

3D modeling

Transducers

Electron microscopes

Sensors

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