Spectroscopic Techniques For The Analysis Of CdTe Substrates Used For The Growth Of HgCdTe

Donald E. Cooper; J. Bajaj; Robert C. Bowman Jr.

doi:10.1117/12.960632

12 September 1989 Spectroscopic Techniques For The Analysis Of CdTe Substrates Used For The Growth Of HgCdTe

Donald E. Cooper, J. Bajaj, Robert C. Bowman Jr.

Proceedings Volume 1106, Future Infrared Detector Materials; (1989) https://doi.org/10.1117/12.960632
Event: SPIE 1989 Technical Symposium on Aerospace Sensing, 1989, Orlando, FL, United States

Abstract

Photoluminescence (PL) and electron paramagnetic resonance (EPR) are powerful techniques for both fundamental studies and potential materials screening of CdTe substrates for HgCdTe growth. Certain extended defects that are common in epitaxial CdTe have a distinctive PL signature that correlates with X-ray measurements of crystallinity. Bulk samples with prominent subgrain structure also have this PL feature, and cathodoluminescence images show that the defect is localized to the subgrain boundary regons. PL and EPR are very sensitive techniques, and specific impurities such as Fe or Ag have been observed in some nominally pure samples. PL and EPR spectroscopy can also detect changes associated with thermal annealing treatments, which alter the stoichiometry of CdTe by varying the number of Cd vacancies and interstitials. These findings illustrate the versatility of PL and EPR as nondestructive techniques to assess the quality of substrates for IR-detector materials.

Citation Download Citation

Donald E. Cooper, J. Bajaj, and Robert C. Bowman Jr. "Spectroscopic Techniques For The Analysis Of CdTe Substrates Used For The Growth Of HgCdTe", Proc. SPIE 1106, Future Infrared Detector Materials, (12 September 1989); https://doi.org/10.1117/12.960632

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