Paper
10 May 2019 Three-dimensional structure analysis of EB-PVD thermal barrier coatings
Yuqi Gu, Bo Ao, Guanhua Wu, Wei Wu
Author Affiliations +
Proceedings Volume 11068, Second Symposium on Novel Technology of X-Ray Imaging; 110682L (2019) https://doi.org/10.1117/12.2524751
Event: Second Symposium on Novel Technology of X-Ray Imaging, 2018, Hefei, China
Abstract
The three-dimensional structure of thermal barrier coatings has an important effect on its performance. Thermal barrier coatings prepared by electron beam physical vapor deposition (EB-PVD) was investigated, and a hightemperature oxidation experiment at 1050℃ was carried out, three-dimensional(3D) imaging were performed by micro- CT and focused ion beam-scanning electron microscopy, and the three-dimensional structure of EB-PVD thermal barrier coatings was obtained. Three-dimensional distribution of thermally grown oxide, inter-diffusion zone, pores, microcracks were obtained, and the thickness of TGO and micro-cracks were quantitatively analyzed. The results show that the TGO thickness analyzed by micro-CT and FIB-SEM are consistent with SEM results, the average depth of microcracks is 0.14 μm, and the micro-cracks only can be observed by a higher resolution micro-CT.
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Yuqi Gu, Bo Ao, Guanhua Wu, and Wei Wu "Three-dimensional structure analysis of EB-PVD thermal barrier coatings", Proc. SPIE 11068, Second Symposium on Novel Technology of X-Ray Imaging, 110682L (10 May 2019); https://doi.org/10.1117/12.2524751
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KEYWORDS
3D modeling

3D image processing

Scanning electron microscopy

Thin film coatings

3D microstructuring

Image segmentation

Oxidation

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