Random two-step phase estimation based on Lissajous ellipse fitting method with light source intensity instability

Jinjin Zhu; Yuxiang Wu; Yashuo Bai; Wei Li; Xiaopeng Shao

doi:10.1117/12.2538785

18 November 2019 Random two-step phase estimation based on Lissajous ellipse fitting method with light source intensity instability

Jinjin Zhu, Yuxiang Wu, Yashuo Bai, Wei Li, Xiaopeng Shao

Author Affiliations +

Proceedings Volume 11189, Optical Metrology and Inspection for Industrial Applications VI; 111890W (2019) https://doi.org/10.1117/12.2538785
Event: SPIE/COS Photonics Asia, 2019, Hangzhou, China

Abstract

The fringe projection technique is an effective technique to measure 3D shape of objects, in which phase retrieval is an important procedure. In this paper, the phase extraction algorithm of random phase-shift, which can be used in the fluctuating light source and the non-uniform background intensity and modulation amplitude, is proposed. The proposed method can retain more details of reconstructed phase than Fourier transform profilometry. Compared with multi-frame phase-shifting method, the proposed method only needs two fringe patterns to extract the phase and phase shift of the object. Our method consists of two stages. Firstly, the method is built based upon Lissajous Ellipse Fitting technique that extracts the phase from only two phase-shifted fringes which may contain arbitrary and unknown phase shift in dynamic measurement experiment. Second, the non-uniform background intensity and modulation amplitude are removed. The simulation results demonstrate that the proposed method can effectively obtain the phase.

Citation Download Citation

Jinjin Zhu, Yuxiang Wu, Yashuo Bai, Wei Li, and Xiaopeng Shao "Random two-step phase estimation based on Lissajous ellipse fitting method with light source intensity instability", Proc. SPIE 11189, Optical Metrology and Inspection for Industrial Applications VI, 111890W (18 November 2019); https://doi.org/10.1117/12.2538785

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