Paper
20 December 2019 Automatic test system for multiwavelength laser-induced damage threshold measurements
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Proceedings Volume 11209, Eleventh International Conference on Information Optics and Photonics (CIOP 2019); 112091S (2019) https://doi.org/10.1117/12.2547608
Event: Eleventh International Conference on Information Optics and Photonics (CIOP 2019), 2019, Xi'an, China
Abstract
Laser-induced damage threshold is an important parameter to evaluate the performance of the optical components in high power laser systems. An automated test system is presented to measure multiwavelength laser-induced damage threshold. The presented system can be able to operate the 1-on-1 and R-on-1 methodologies at 1064nm, 532nm, and 355nm. Some solutions are presented to improve the measurement efficiency and the reliability. Experimental results are also provided to confirm the capabilities of the proposed test system.
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Jie Li, Rongsheng Ba, Xinda Zhou, Yinbo Zheng, Lei Ding, Liqun Chai, Huan Ren, and Xiaodong Tang "Automatic test system for multiwavelength laser-induced damage threshold measurements", Proc. SPIE 11209, Eleventh International Conference on Information Optics and Photonics (CIOP 2019), 112091S (20 December 2019); https://doi.org/10.1117/12.2547608
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KEYWORDS
Laser induced damage

Laser damage threshold

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