Noise control in dual-frequency VECSELs for Cs CPT Clocks (Conference Presentation)

Fabien Bretenaker; Gregory Gredat; Hui Liu; Fabienne Goldfarb; Ghaya Baili; François Gutty; Isabelle Sagnes; Jeremy Cotxet; François Tricot

doi:10.1117/12.2545583

9 March 2020 Noise control in dual-frequency VECSELs for Cs CPT Clocks (Conference Presentation)

Fabien Bretenaker, Gregory Gredat, Hui Liu, Fabienne Goldfarb, Ghaya Baili, François Gutty, Isabelle Sagnes, Jeremy Cotxet, François Tricot

Author Affiliations +

Proceedings Volume 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II; 112960A (2020) https://doi.org/10.1117/12.2545583
Event: SPIE OPTO, 2020, San Francisco, California, United States

Abstract

Atomic clocks based on Coherent Population Trapping (CPT) in cesium [1] or other sensors based on CPT require the development of specific low noise laser sources at resonant wavelengths. For instance, the double lambda scheme for CPT probed by lin ⊥ lin laser beams, which has been shown to create Raman–Ramsey fringes with a larger contrast than the usual simple lambda scheme in [2], requires the availability of two cross-linearly polarized frequencies at 852 nm with a low beat note phase noise and a low intensity noise. One way to generate these two frequencies with low amplitude and phase noises is to build a dual-frequency VECSEL (Vertical External Cavity Surface Emitting Laser) [3]. In this talk we will present our efforts to understand the physical origin of the laser amplitude and phase noises [4], and the developments that we have made to reduce these noises to the levels necessary to achieve a relative clock stability of 10-13 at 1 s integration time.

Conference Presentation

Citation Download Citation

Fabien Bretenaker, Gregory Gredat, Hui Liu, Fabienne Goldfarb, Ghaya Baili, François Gutty, Isabelle Sagnes, Jeremy Cotxet, and François Tricot "Noise control in dual-frequency VECSELs for Cs CPT Clocks (Conference Presentation)", Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112960A (9 March 2020); https://doi.org/10.1117/12.2545583

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