Presentation + Paper
21 August 2020 Using wavelet transform to evaluate single-shot phase measuring deflectometry data
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Abstract
Phase measuring deflectometry (PMD) is a well-established method for determining the topography of specular freeform surfaces. A disadvantage of the classical PMD method, however, is the sequential measurement process - it requires at least six camera images of phase-shifted sinusoidal fringe patterns for one measurement. Therefore, for moving objects in industrial production, as well as for non-fixable objects such as the human cornea, the classical PMD evaluation is not suitable anymore. To overcome this problem, single-shot methods using single-side-band demodulation have been presented, which allow for a deflectometric measurement based on just one single image capture. However, this kind of evaluation does not work for complex surface geometries that result in broadband fringe patterns, since the phase is only considered globally in the Fourier space. A new single-shot evaluation method for the phase determination using the Continuous Wavelet Transform (CWT) is presented. The advantage of the wavelet transform is that the signal can be evaluated locally in both spatial and frequency space, making it possible to measure even complex reflective surfaces in motion. First measurement results are shown and compared to the classic phase-shifting evaluation for a non-moving object. Furthermore, limits and possible enhancements of this new method are discussed. Phase measuring deflectometry (PMD) is a well-established method for determining the topography of specular freeform surfaces. A disadvantage of the classical PMD method, however, is the sequential measurement process - it requires at least six camera images of phase-shifted sinusoidal fringe patterns for one measurement. Therefore, for moving objects in industrial production, as well as for non-fixable objects such as the human cornea, the classical PMD evaluation is not suitable anymore. To overcome this problem, single-shot methods using single-side-band demodulation have been presented, which allow for a deflectometric measurement based on just one single image capture. However, this kind of evaluation does not work for complex surface geometries that result in broadband fringe patterns, since the phase is only considered globally in the Fourier space. A new single-shot evaluation method for the phase determination using the Continuous Wavelet Transform (CWT) is presented. The advantage of the wavelet transform is that the signal can be evaluated locally in both spatial and frequency space, making it possible to measure even complex reflective surfaces in motion. First measurement results are shown and compared to the classic phase-shifting evaluation for a non-moving object. Furthermore, limits and possible enhancements of this new method are discussed.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hanning Liang, Tomas Sauer, and Christian Faber "Using wavelet transform to evaluate single-shot phase measuring deflectometry data", Proc. SPIE 11510, Applications of Digital Image Processing XLIII, 115101S (21 August 2020); https://doi.org/10.1117/12.2567301
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KEYWORDS
Fringe analysis

Cameras

Wavelet transforms

Wavelets

Phase shifts

Deflectometry

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