Poster + Presentation + Paper
13 October 2020 Tip wear improvements in advanced nanomachining
Author Affiliations +
Conference Poster
Abstract
Nanomachining is typically described as being a material-independent subtractive mask repair process. This is a correct statement, for the most part, since it does not require a material end-stop nor chemistries targeted to remove only a specific material. However, it is not true when considering the effect of materials being removed on the integrity of the nanomachining tip (also referred to here as NanoBitsTM). While many advanced absorber materials such as OMOG are easier to nanomachine than earlier absorber materials such as chrome and MoSi, the absorbers used in EUV have proven to be much harder and tougher (in a nanomechanical sense) while sitting atop a very fragile multilayer substrate. This work shows results from advancements on the latest nanomachining platform, nm-VI to minimize tip wear during the repair process. Consequently, this improves defect repair capability for smaller dimensions, decreases overhead from tip changeouts, decreases the cost of consumables by increasing NanoBit lifetime, and increases repair tool return-on-investment.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Maria J. Cadena, Marino Romanello, Daniel Yi, Tod Robinson, David Brinkley, and Marty Klos "Tip wear improvements in advanced nanomachining", Proc. SPIE 11518, Photomask Technology 2020, 1151811 (13 October 2020); https://doi.org/10.1117/12.2573094
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KEYWORDS
Chemistry

Extreme ultraviolet

Molecular machines

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