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10 October 2020 Positional misalignment correction for Fourier ptychographic microscopy based on intensity distribution
Wei Huang, Shuixin Pan, Qi Zhou, Meihua Liao, Chenggong Zhang, Qijian Tang, Xiaoli Liu, Xiang Peng
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Proceedings Volume 11549, Advanced Optical Imaging Technologies III; 115490D (2020) https://doi.org/10.1117/12.2583686
Event: SPIE/COS Photonics Asia, 2020, Online Only
Abstract
Fourier ptychographic microscopy is a newly developed method to extend the resolution beyond the conventional limit defined by a microscope optics. The positions of the LED sources strongly determine the quality of the reconstructed result. In this paper, we propose a new positional misalignment correction method, which is based on the distribution of the incident LED intensity. When the LED matrix panel has displacements along x-axis, or y-axis, the incident LED intensity distribution which propagates to the sample plane will be changed. An optimization method to correct positional misalignment is introduced, as well as the light intensity correction. Simulation has been performed to verify the effectiveness of the proposed method, which demonstrates that the reconstructed result shows a better quality.
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Wei Huang, Shuixin Pan, Qi Zhou, Meihua Liao, Chenggong Zhang, Qijian Tang, Xiaoli Liu, and Xiang Peng "Positional misalignment correction for Fourier ptychographic microscopy based on intensity distribution", Proc. SPIE 11549, Advanced Optical Imaging Technologies III, 115490D (10 October 2020); https://doi.org/10.1117/12.2583686
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KEYWORDS
Light emitting diodes
Microscopy
Image quality
LED displays
Microscopes
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