Soft-Electron Background In X-Ray Telescopes Using Grazing-Incidence Optics In Near-Earth Orbits

T. J. Sumner

doi:10.1117/12.962661

28 July 1989 Soft-Electron Background In X-Ray Telescopes Using Grazing-Incidence Optics In Near-Earth Orbits

T. J. Sumner

Proceedings Volume 1160, X-Ray/EUV Optics for Astronomy and Microscopy; (1989) https://doi.org/10.1117/12.962661
Event: 33rd Annual Technical Symposium, 1989, San Diego, United States

Abstract

Background in x-ray to in near-Earth orbits from low-energy electrons (<100 keV) has long been a source of concern. Recent data on low-energy electron populations and improvements in the modelling of the propagation of low-energy electrons through grazing-incidence optical systems now allows better quantitative estimates of the electron throughput of such systems to be made. The modelling which has recently been done with respect to the U.K. soft x-ray to (WFC) on ROSAT will be described. The results from the modelling will then be applied to several other missions using grazing-incidence optics and the implications discussed.

Citation Download Citation

T. J. Sumner "Soft-Electron Background In X-Ray Telescopes Using Grazing-Incidence Optics In Near-Earth Orbits", Proc. SPIE 1160, X-Ray/EUV Optics for Astronomy and Microscopy, (28 July 1989); https://doi.org/10.1117/12.962661

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