Paper
20 December 1989 Radial Metrology With A Panoramic Annular Lens
Donald R. Matthys, Pal Greguss, John A. Gilbert, David L. Lehner, Amy S. Kransteuber
Author Affiliations +
Abstract
In the present paper, cavity shapes are profiled using two opposing collinear panoramic annular lenses. A speckle pattern is projected out from one panoramic annular lens onto a reference stan d or onto lle cavity wall itself, and the resulting speckle distribution is recorded through e second panoramic annular lens. Since the speckle pattern moves as the shape of the cavity changes, H e variation in cavity shape can be measured by applying correlation techniques to the speckle patterns obtained before and after the cavity shape is modified. The apparent speckle movement is computed by numerically correlating small subsets extracted from each pattern. These shifts are used to measure surface deflections or to contour the cavity with respect to a reference shape.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Donald R. Matthys, Pal Greguss, John A. Gilbert, David L. Lehner, and Amy S. Kransteuber "Radial Metrology With A Panoramic Annular Lens", Proc. SPIE 1164, Surface Characterization and Testing II, (20 December 1989); https://doi.org/10.1117/12.962820
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Calibration

Speckle pattern

Panoramic photography

Speckle

Algorithm development

Metrology

Digital image correlation

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