Emissivity measurement with the dual-temperature method

Gangbo Hu; Zhuoqiao Wu; Xue Yang; Ning Tao; Cunlin Zhang

doi:10.1117/12.2602730

9 October 2021 Emissivity measurement with the dual-temperature method

Gangbo Hu, Zhuoqiao Wu, Xue Yang, Ning Tao, Cunlin Zhang

Proceedings Volume 11906, Infrared, Millimeter-Wave, and Terahertz Technologies VIII; 119061C (2021) https://doi.org/10.1117/12.2602730
Event: SPIE/COS Photonics Asia, 2021, Nantong, JS, China

Conference Poster

Abstract

Emissivity is one of the important parameters to reflect the thermal characteristics of the surface of an object. It plays a great role in the research of infrared coatings with high or low emissivity. In this paper, a novel non-contact experimental method is proposed to measure the coating’s emissivity using the dual-temperature method, and the error of the measured infrared emissivity with different base board materials is analyzed.

Citation Download Citation

Gangbo Hu, Zhuoqiao Wu, Xue Yang, Ning Tao, and Cunlin Zhang "Emissivity measurement with the dual-temperature method", Proc. SPIE 11906, Infrared, Millimeter-Wave, and Terahertz Technologies VIII, 119061C (9 October 2021); https://doi.org/10.1117/12.2602730

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