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This presentation will introduce a modified blaze condition of a digital micromirror device for structured illumination microscopy. This condition aims to remove a special mask at the Fourier plane, which blocks unwanted orders to make two or three beams interference. The proposed alignment is intrinsically free from the zeroth order of diffraction light. So, we can generate structured light by uploading proper patterns onto DMD with an iris diaphragm instead of the special mask. By adjusting the size of the iris diaphragm, structured light with various periods can be illuminated to the sample. The basic concept, and experiment results with a modified blaze condition will be presented.
Jongwu Kim andDug Young Kim
"Modified blaze condition of a digital micromirror device for structured illumination microscopy", Proc. SPIE 11967, Single Molecule Spectroscopy and Superresolution Imaging XV, 119670C (2 March 2022); https://doi.org/10.1117/12.2608524
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Jongwu Kim, Dug Young Kim, "Modified blaze condition of a digital micromirror device for structured illumination microscopy," Proc. SPIE 11967, Single Molecule Spectroscopy and Superresolution Imaging XV, 119670C (2 March 2022); https://doi.org/10.1117/12.2608524