Presentation + Paper
2 March 2022 Optical temperature measurement across IR opaque Iayers by means of visible excitation and photoluminescence
Author Affiliations +
Abstract
With the technique here proposed, we exploit the temperature variation of the photoluminescence of a direct bandgap semiconductor to achieve a full contact-less thermometry. The proposed method is based on the spectral measurement of the PL signal emitted from a red LED chip when excited by means of a 532 nm solid state laser. Both PL emission peak wavelength and FWHM are used to improve the temperature estimation. The proposed method has been demonstrated on an extended temperature range, from cryogenic (90 K) to 460 K; a ±1 K of uncertainty due to calibration, ±0.7 K of measurement accuracy and ±0.3 K of precision are demonstrated on a temperature range of 300 K.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nicola Trivellin, Matteo Buffolo, Carlo De Santi, Matteo Meneghini, Michele Forzan, Fabrizio Dughiero, Enrico Zanoni, and Gaudenzio Meneghesso "Optical temperature measurement across IR opaque Iayers by means of visible excitation and photoluminescence", Proc. SPIE 12016, Optical and Quantum Sensing and Precision Metrology II, 120160V (2 March 2022); https://doi.org/10.1117/12.2607727
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KEYWORDS
Temperature metrology

Light emitting diodes

Calibration

Luminescence

Infrared imaging

Thermography

Opacity

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