Paper
27 March 2022 A calibration system adopting 405 nm laser for soft x-ray TESs
Shuo Zhang, JingKai Xia, BingJun Wu
Author Affiliations +
Proceedings Volume 12169, Eighth Symposium on Novel Photoelectronic Detection Technology and Applications; 121691L (2022) https://doi.org/10.1117/12.2622281
Event: Eighth Symposium on Novel Photoelectronic Detection Technology and Applications, 2021, Kunming, China
Abstract
In the case of no synchrotron radiation source or free electron X-ray laser, it is difficult to obtain narrow energy-band X-rays in energy range lower than the 1 keV, which mainly owing to that soft X-rays are easily absorbed, and the low fluorescence efficiency of this energy range, thus the fluorescence photons are often submerged under a strong scattering background.1 In order to complete the calibration of TES chips in this energy range, our team built up a set of intrinsic energy resolution calibration system for TESs by the 405 nm laser.2-4 Its working principle, structure and preliminary test results will be briefly introduced in this paper.
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shuo Zhang, JingKai Xia, and BingJun Wu "A calibration system adopting 405 nm laser for soft x-ray TESs", Proc. SPIE 12169, Eighth Symposium on Novel Photoelectronic Detection Technology and Applications, 121691L (27 March 2022); https://doi.org/10.1117/12.2622281
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KEYWORDS
Calibration

X-ray detectors

X-rays

Photons

Pulsed laser operation

Laser systems engineering

Sensors

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